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UHV SYSTEM FOR INSITU PREPARATION AND ANALYSIS OF THIN-FILMS AND SURFACES
被引:9
作者
:
SHAPIRA, Y
论文数:
0
引用数:
0
h-index:
0
SHAPIRA, Y
GRUNBAUM, E
论文数:
0
引用数:
0
h-index:
0
GRUNBAUM, E
机构
:
来源
:
VACUUM
|
1978年
/ 28卷
/ 12期
关键词
:
D O I
:
10.1016/0042-207X(78)90003-9
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:523 / 526
页数:4
相关论文
共 5 条
[1]
DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
BENNINGHOVEN, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MUNSTER,PHYSIKAL INST,D-44 MUNSTER,FED REP GER
UNIV MUNSTER,PHYSIKAL INST,D-44 MUNSTER,FED REP GER
BENNINGHOVEN, A
[J].
SURFACE SCIENCE,
1975,
53
(DEC)
: 596
-
625
[2]
AUGER ELECTRON SPECTROSCOPY
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1971,
25
(01)
: 53
-
+
[3]
CHANG LL, 1975, EPITAXIAL GROWTH, pCH2
[4]
SCANNING ELECTRON DIFFRACTION OF FILM GROWTH
GRIGSON, CWB
论文数:
0
引用数:
0
h-index:
0
GRIGSON, CWB
DOVE, DB
论文数:
0
引用数:
0
h-index:
0
DOVE, DB
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1966,
3
(03):
: 120
-
&
[5]
GRUNBAUM E, 1973, VACUUM, V24, P153
←
1
→
共 5 条
[1]
DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
BENNINGHOVEN, A
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MUNSTER,PHYSIKAL INST,D-44 MUNSTER,FED REP GER
UNIV MUNSTER,PHYSIKAL INST,D-44 MUNSTER,FED REP GER
BENNINGHOVEN, A
[J].
SURFACE SCIENCE,
1975,
53
(DEC)
: 596
-
625
[2]
AUGER ELECTRON SPECTROSCOPY
CHANG, CC
论文数:
0
引用数:
0
h-index:
0
CHANG, CC
[J].
SURFACE SCIENCE,
1971,
25
(01)
: 53
-
+
[3]
CHANG LL, 1975, EPITAXIAL GROWTH, pCH2
[4]
SCANNING ELECTRON DIFFRACTION OF FILM GROWTH
GRIGSON, CWB
论文数:
0
引用数:
0
h-index:
0
GRIGSON, CWB
DOVE, DB
论文数:
0
引用数:
0
h-index:
0
DOVE, DB
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1966,
3
(03):
: 120
-
&
[5]
GRUNBAUM E, 1973, VACUUM, V24, P153
←
1
→