AUGER ELECTRON SPECTROSCOPY

[1] AUGER SPECTROSCOPY OF GRAPHITE SINGLE CRYSTALS WITH LOW ENERGY ELECTRONS [J]. SURFACE SCIENCE, 1968, 11 (02) : 242 - +

[2] AMELIO GF, 1969, STRUCTURE CHEMISTRY, P11

[3] AMELIO GF, 1968, THESIS GEORGIA I TEC

[4] The effect of a photoelectric compound [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1925, 6 : 205 - U12

[5] BERGSTROM I, 1965, ALPHA BETA GAMMA RAY, V2, P1523

[6] BETTERIDGE D, 1970, ANAL CHEM, V42, pA43

[7] ELECTRON SCATTERING IN THICK TARGETS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (06): : 703 - &

[8] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &

[9] CHARACTERISTIC IONIZATION LOSSES OBSERVED IN AUGER EMISSION SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1970, 16 (01) : 21 - &

[10] AUGER SPECTROSCOPY OF SILICON [J]. SURFACE SCIENCE, 1969, 17 (02) : 462 - &

[1] AUGER SPECTROSCOPY OF GRAPHITE SINGLE CRYSTALS WITH LOW ENERGY ELECTRONS [J]. SURFACE SCIENCE, 1968, 11 (02) : 242 - +

[2] AMELIO GF, 1969, STRUCTURE CHEMISTRY, P11

[3] AMELIO GF, 1968, THESIS GEORGIA I TEC

[4] The effect of a photoelectric compound [J]. JOURNAL DE PHYSIQUE ET LE RADIUM, 1925, 6 : 205 - U12

[5] BERGSTROM I, 1965, ALPHA BETA GAMMA RAY, V2, P1523

[6] BETTERIDGE D, 1970, ANAL CHEM, V42, pA43

[7] ELECTRON SCATTERING IN THICK TARGETS [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1967, 18 (06): : 703 - &

[8] ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J]. JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) : 1740 - &

[9] CHARACTERISTIC IONIZATION LOSSES OBSERVED IN AUGER EMISSION SPECTROSCOPY [J]. APPLIED PHYSICS LETTERS, 1970, 16 (01) : 21 - &

[10] AUGER SPECTROSCOPY OF SILICON [J]. SURFACE SCIENCE, 1969, 17 (02) : 462 - &