AUGER ELECTRON SPECTROSCOPY

被引：419

作者：

CHANG, CC

机构：

来源：

SURFACE SCIENCE | 1971年 / 25卷 / 01期

关键词：

D O I：

10.1016/0039-6028(71)90210-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：53 / +

页数：1

共 53 条

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SEWELL, PB ;

COHEN, M .

APPLIED PHYSICS LETTERS, 1967, 11 (09) :298-&

[42] EFFECTS OF PLASMA SCREENING AND AUGER RECOMBINATION ON LUMINESCENT EFFICIENCY IN GAP [J].

SINHA, KP ;

DIDOMENICO, M .

PHYSICAL REVIEW B-SOLID STATE, 1970, 1 (06) :2623-+

[43]

Spangenberg KR, 1948, VACUUM TUBES

[44] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS [J].

TAYLOR, NJ .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) :792-&

[45] ENERGY SPECTRA OF INELASTICALLY SCATTERED ELECTRONS AND LEED STUDIES OF TUNGSTEN [J].

THARP, LN ;

SCHEIBNE.EJ .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (08) :3320-&

[46] AUGER ELECTRON SPECTROMETER PREAMPLIFIER [J].

TRACY, JC ;

BOHN, GK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1970, 41 (04) :591-&

[47] USE OF AUGER ELECTRON SPECTROSCOPY IN DETERMINING EFFECT OF CARBON AND OTHER SURFACE CONTAMINANTS ON GAAS-CS-O PHOTOCATHODES [J].

UEBBING, JJ .

JOURNAL OF APPLIED PHYSICS, 1970, 41 (02) :802-&

[48] DETERMINATION OF SURFACE STRUCTURES USING LEED AND ENERGY ANALYSIS OF SCATTERED ELECTRONS [J].

WEBER, RE ;

JOHNSON, AL .

JOURNAL OF APPLIED PHYSICS, 1969, 40 (01) :314-&

[49] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J].

WEBER, RE ;

PERIA, WT .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4355-&

[50] STUDIES OF SILICON AND ITS OXYGEN ADSORPTION BY LOW ENERGY ELECTRON SCATTERING [J].

WEI, PSP .

SURFACE SCIENCE, 1970, 20 (01) :157-&

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