USE OF AUGER ELECTRON SPECTROSCOPY IN DETERMINING EFFECT OF CARBON AND OTHER SURFACE CONTAMINANTS ON GAAS-CS-O PHOTOCATHODES

被引：39

作者：

UEBBING, JJ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1970年 / 41卷 / 02期

关键词：

D O I：

10.1063/1.1658753

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：802 / &

共 12 条

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[9] AUGER ELECTRON SPECTROSCOPY OF CLEAN GALLIUM ARSENIDE [J].

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[10]

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