AUGER SPECTROSCOPY OF SILICON

[1] ON NATURE OF ANNEALED SEMICONDUCTOR SURFACES [J]. PHYSICS LETTERS A, 1968, A 26 (11) : 530 - &

[2] AUGER SPECTROSCOPY OF SILICON [J]. SURFACE SCIENCE, 1969, 17 (02) : 462 - &

[3] BURHOP EHS, 1952, AUGER EFFECT, P1

[4] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[5] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[6] THIN REACTION LAYERS AND SURFACE STRUCTURE OF SILICON(111) [J]. SURFACE SCIENCE, 1969, 15 (01) : 169 - &

[7] TAYLOR NJ, TO BE PUBLISHED

[8] LEED STUDY OF A NICKEL INDUCED SURFACE STRUCTURE ON SILICON (3) [J]. SURFACE SCIENCE, 1967, 8 (04) : 467 - +

[9] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) : 4355 - &

[10] [No title captured]

[1] ON NATURE OF ANNEALED SEMICONDUCTOR SURFACES [J]. PHYSICS LETTERS A, 1968, A 26 (11) : 530 - &

[2] AUGER SPECTROSCOPY OF SILICON [J]. SURFACE SCIENCE, 1969, 17 (02) : 462 - &

[3] BURHOP EHS, 1952, AUGER EFFECT, P1

[4] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[5] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[6] THIN REACTION LAYERS AND SURFACE STRUCTURE OF SILICON(111) [J]. SURFACE SCIENCE, 1969, 15 (01) : 169 - &

[7] TAYLOR NJ, TO BE PUBLISHED

[8] LEED STUDY OF A NICKEL INDUCED SURFACE STRUCTURE ON SILICON (3) [J]. SURFACE SCIENCE, 1967, 8 (04) : 467 - +

[9] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J]. JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) : 4355 - &

[10] [No title captured]