ON NATURE OF ANNEALED SEMICONDUCTOR SURFACES

被引：38

作者：

BAUER, E

机构：

来源：

PHYSICS LETTERS A | 1968年 / A 26卷 / 11期

关键词：

D O I：

10.1016/0375-9601(68)90528-8

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：530 / &

共 9 条

[1] MULTIPLE SCATTERING VERSUS SUPERSTRUCTURES IN LOW ENERGY ELECTRON DIFFRACTION [J].

BAUER, E .

SURFACE SCIENCE, 1967, 7 (03) :351-&

[2]

BAUER E, 152 COLL INT CNRS 19, P19

[3] INTERPRETATION OF LOW ENERGY ELECTRON DIFFRACTION DATA TO PREDICT SURFCE ATOM ARRANGEMENTS [J].

HANSEN, NR ;

HANEMAN, D .

SURFACE SCIENCE, 1964, 2 :566-574

[4] STRUCTURES OF CLEAN SURFACES OF GERMANIUM AND SILICON .1. [J].

LANDER, JJ ;

MORRISON, J .

JOURNAL OF APPLIED PHYSICS, 1963, 34 (05) :1403-&

[5] LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES [J].

LANDER, JJ ;

MORRISON, J .

JOURNAL OF CHEMICAL PHYSICS, 1962, 37 (04) :729-&

[6] STRUCTURE AND ADSORPTION CHARACTERISTICS OF CLEAN SURFACES OF GERMANIUM AND SILICON [J].

SCHLIER, RE ;

FARNSWORTH, HE .

JOURNAL OF CHEMICAL PHYSICS, 1959, 30 (04) :917-926

[7] POSSIBLE STRUCTURES FOR CLEAN, ANNEALED SURFACES OF GERMANIUM AND SILICON [J].

SEIWATZ, R .

SURFACE SCIENCE, 1964, 2 :473-483

[8] LEED STUDY OF A NICKEL INDUCED SURFACE STRUCTURE ON SILICON (3) [J].

VANBOMMEL, AJ ;

MEYER, F .

SURFACE SCIENCE, 1967, 8 (04) :467-+

[9] USE OF LEED APPARATUS FOR DETECTION AND IDENTIFICATION OF SURFACE CONTAMINANTS [J].

WEBER, RE ;

PERIA, WT .

JOURNAL OF APPLIED PHYSICS, 1967, 38 (11) :4355-&

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