LOW-ENERGY ELECTRON DIFFRACTION STUDY OF SILICON SURFACE STRUCTURES

被引：249

作者：

LANDER, JJ

MORRISON, J

机构：

来源：

JOURNAL OF CHEMICAL PHYSICS | 1962年 / 37卷 / 04期

关键词：

D O I：

10.1063/1.1733155

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

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页码：729 / &

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[10] DISPLACEMENT PROCESSES ON GERMANIUM SURFACES
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