RECENT ADVANCEMENTS IN THE FIELD OF IMAGE INTENSIFICATION - GENERATION 3-WAFER TUBE

被引：24

作者：

CSORBA, IP

机构：

[1] ITT Electro-Optical Products Division, Roanoke, VA, 24019

来源：

APPLIED OPTICS | 1979年 / 18卷 / 14期

关键词：

D O I：

10.1364/AO.18.002440

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The construction, performance characteristics, and the photocathode of the generation 3 wafer tube are discussed and presented. The discussion concentrates on the fundamental aspects of image intensification with the generation 3 wafer tube. © 1979 Optical Society of America.

引用

页码：2440 / 2444

页数：5

共 17 条

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CSORBA, IP
[J]. APPLIED OPTICS, 1977, 16 (10): : 2647 - 2650
[4] CSORBA IP, 1979, DAAG5376C0203 CONTR
[5] CSORBA IP, 1962, DA44009ENG3914 CONTR
[6] CSORBA IP, 1971, RCA REV, V31, P297
[7] CSORBA IP, 1976 P EL OPT SYST D, P646
[8] A REFLECTOMETER FOR MEASURING DIFFUSE REFLECTANCE IN THE VISIBLE AND INFRARED REGIONS
DERKSEN, WL
MONAHAN, TI
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1952, 42 (04) : 263 - 265
[9] PHOTOELECTRON SURFACE ESCAPE PROBABILITY OF (GA,IN)AS-CS-O IN 0.9 TO - 1.6 MUM RANGE
FISHER, DG
ENSTROM, RE
ESCHER, JS
WILLIAMS, BF
[J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (09) : 3815 - &
[10] FISHER DG, 1974, ADV IMAGE PICKUP DIS, V1

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