EXPERIMENTAL RESULTS OF PHOTOTHERMAL MICROSTRUCTURAL DEPTH PROFILING

被引：55

作者：

LAN, TTN ^{[1
]}

SEIDEL, U ^{[1
]}

WALTHER, HG ^{[1
]}

GOCH, G ^{[1
]}

SCHMITZ, B ^{[1
]}

机构：

[1] UNIV ULM, INST LASERTECHNOL MED & MESSTECH, ARBEITSGRP LASERMESSTECH, D-89081 ULM, GERMANY

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 78卷 / 06期

关键词：

D O I：

10.1063/1.359869

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Experimental results of thermal conductivity depth profiling of case-hardened steel and mechanically loaded ceramics are presented, based on an inversion algorithm for a sample with piecewise linearly inhomogeneous depth profile of the thermal conductivity, The photothermally obtained profiles are interpreted or compared with results from conventional or destructive measuring techniques. (C) 1995 American Institute of Physics.

引用

页码：4108 / 4111

页数：4

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