ELLIPSOMETRIC STUDIES ON ZINC-SULFIDE THIN-FILMS GROWN BY ATOMIC LAYER EPITAXY

[1] Afanasjev V., 1985, Ferroelectrics, V65, P175, DOI 10.1080/00150198508008896

[2] THE INFLUENCE OF DEPOSITION PARAMETERS ON THE OPTICAL-PROPERTIES AND GROWTH OF ZNS FILMS [J]. THIN SOLID FILMS, 1983, 100 (04) : 273 - 281

[3] Aspnes D. E., 1983, Journal de Physique Colloque, V44, P3, DOI 10.1051/jphyscol:19831001

[4] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J]. PHYSICAL REVIEW B, 1979, 20 (08): : 3292 - 3302

[5] ASPNES DE, 1983, P SOC PHOTOOPT INSTR, V452, P60

[6] NEW INTERFEROMETRIC METHOD FOR DETERMINING REFRACTIVE-INDEX OF THIN DIELECTRIC FILM, ITS THICKNESS, PHASE-SHIFT, AND ORDER OF INTERFERENCE [J]. APPLIED PHYSICS, 1977, 14 (03): : 319 - 323

[7] REFRACTIVE INDEXES OF SINGLE HEXAGONAL ZNS AND CDS CRYSTALS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (04) : 496 - &

[8] Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances [J]. ANNALEN DER PHYSIK, 1935, 24 (07) : 636 - 664

[9] REFRACTIVE INDICES OF ZNO ZNS AND SEVERAL THIN-FILM INSULATORS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (07) : 729 - +

[10] OPTICAL PROPERTIES AND BAND STRUCTURE OF WURTZITE-TYPE CRYSTALS AND RUTILE [J]. PHYSICAL REVIEW, 1965, 137 (5A): : 1467 - +

[1] Afanasjev V., 1985, Ferroelectrics, V65, P175, DOI 10.1080/00150198508008896

[2] THE INFLUENCE OF DEPOSITION PARAMETERS ON THE OPTICAL-PROPERTIES AND GROWTH OF ZNS FILMS [J]. THIN SOLID FILMS, 1983, 100 (04) : 273 - 281

[3] Aspnes D. E., 1983, Journal de Physique Colloque, V44, P3, DOI 10.1051/jphyscol:19831001

[4] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J]. PHYSICAL REVIEW B, 1979, 20 (08): : 3292 - 3302

[5] ASPNES DE, 1983, P SOC PHOTOOPT INSTR, V452, P60

[6] NEW INTERFEROMETRIC METHOD FOR DETERMINING REFRACTIVE-INDEX OF THIN DIELECTRIC FILM, ITS THICKNESS, PHASE-SHIFT, AND ORDER OF INTERFERENCE [J]. APPLIED PHYSICS, 1977, 14 (03): : 319 - 323

[7] REFRACTIVE INDEXES OF SINGLE HEXAGONAL ZNS AND CDS CRYSTALS [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1963, 53 (04) : 496 - &

[8] Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances [J]. ANNALEN DER PHYSIK, 1935, 24 (07) : 636 - 664

[9] REFRACTIVE INDICES OF ZNO ZNS AND SEVERAL THIN-FILM INSULATORS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (07) : 729 - +

[10] OPTICAL PROPERTIES AND BAND STRUCTURE OF WURTZITE-TYPE CRYSTALS AND RUTILE [J]. PHYSICAL REVIEW, 1965, 137 (5A): : 1467 - +