X-RAY TOPOGRAPHIC OBSERVATION OF MOVING DISLOCATIONS IN SILICON CRYSTALS

被引：25

作者：

CHIKAWA, J

ABE, T

FUJIMOTO, I

机构：

来源：

APPLIED PHYSICS LETTERS | 1972年 / 21卷 / 06期

关键词：

D O I：

10.1063/1.1654385

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：295 / &

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