CORRELATED PROTON AND HEAVY-ION UPSET MEASUREMENTS ON IDT STATIC RAMS

被引:9
作者
CAMPBELL, AB [1 ]
STAPOR, WJ [1 ]
KOGA, R [1 ]
KOLASINSKI, WA [1 ]
机构
[1] AEROSPACE CORP,EL SEGUNDO,CA 90245
关键词
D O I
10.1109/TNS.1985.4334084
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:4150 / 4154
页数:5
相关论文
共 3 条
[1]   PROTON UPSETS IN ORBIT [J].
BENDEL, WL ;
PETERSEN, EL .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4481-4485
[2]   THE TOTAL DOSE DEPENDENCE OF THE SINGLE EVENT UPSET SENSITIVITY OF IDT STATIC RAMS [J].
CAMPBELL, AB ;
STAPOR, WJ .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1175-1177
[3]   HEAVY ION-INDUCED SINGLE EVENT UPSETS OF MICROCIRCUITS - A SUMMARY OF THE AEROSPACE CORPORATION TEST DATA [J].
KOGA, R ;
KOLASINSKI, WA .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1190-1195