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IONIZATION SPECTROSCOPY OF CONTAMINATED METAL SURFACES
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DIFFERENCE IN CR L3/L2 INTENSITY RATIO MEASURED BY SOFT-X-RAY AND AUGER-ELECTRON APPEARANCE-POTENTIAL SPECTROSCOPY
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[3]
ANOMALOUS FINE STRUCTURE IN SOFT X-RAY APPEARANCE POTENTIALS OF NONMETALS
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1971, 8 (01)
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[4]
DIRECT COMPARISON OF AUGER-ELECTRON SPECTROSCOPY WITH APPEARANCE POTENTIAL SPECTROSCOPY
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1972, 9 (02)
:603-&
[6]
Sevier K D, 1972, LOW ENERGY ELECTRON
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TRACY JM, PRIVATE COMMUNICATIO