DIFFERENCE IN CR L3/L2 INTENSITY RATIO MEASURED BY SOFT-X-RAY AND AUGER-ELECTRON APPEARANCE-POTENTIAL SPECTROSCOPY

被引：52

作者：

HOUSTON, JE

PARK, RL

机构：

来源：

PHYSICAL REVIEW B | 1972年 / 5卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.5.3808

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

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页码：3808 / &

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[4] LIEFELD RJ, 1968, SOFT XRAY BAND SPECT, P133
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HOUSTON, JE
[J]. SURFACE SCIENCE, 1971, 26 (02) : 664 - &
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