HIGH-RESOLUTION ELECTRON-MICROSCOPY OF A SIGMA=27 BOUNDARY IN SILICON

被引：20

作者：

CUNNINGHAM, B

STRUNK, HP

AST, DG

机构：

来源：

SCRIPTA METALLURGICA | 1982年 / 16卷 / 04期

关键词：

D O I：

10.1016/0036-9748(82)90147-8

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：349 / 352

页数：4

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