NEUTRAL AND ION-BEAM SIMS OF NONCONDUCTING MATERIALS

[1] Andersen H. H., 1981, Sputtering by particle bombardment I. Physical sputtering of single-element solids, P145

[2] FAST ATOM BOMBARDMENT OF SOLIDS AS AN ION-SOURCE IN MASS-SPECTROMETRY [J]. NATURE, 1981, 293 (5830) : 270 - 275

[3] BARBER M, 1982, ANAL CHEM, V54, pA645

[4] BARBER M, 1981, J CHEM SOC CHEM COMM, V325

[5] BENTZ BL, 1983, ANAL CHEM, V55, P1443

[6] Betz G., 1983, SPUTTERING PARTICLE, P11

[7] LOCAL IN-DEPTH ANALYSIS OF CERAMIC MATERIALS BY NEUTRAL BEAM SECONDARY ION MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 361 - 373

[8] BORCHARDT G, 1981, MIKROCHIM ACTA, V2, P421

[9] ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS [J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) : 109 - 115

[10] ANALYSIS OF POLYMER SURFACES BY SIMS .4. A STUDY OF SOME ACRYLIC HOMO-POLYMERS AND CO-POLYMERS [J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (04) : 184 - 192

[1] Andersen H. H., 1981, Sputtering by particle bombardment I. Physical sputtering of single-element solids, P145

[2] FAST ATOM BOMBARDMENT OF SOLIDS AS AN ION-SOURCE IN MASS-SPECTROMETRY [J]. NATURE, 1981, 293 (5830) : 270 - 275

[3] BARBER M, 1982, ANAL CHEM, V54, pA645

[4] BARBER M, 1981, J CHEM SOC CHEM COMM, V325

[5] BENTZ BL, 1983, ANAL CHEM, V55, P1443

[6] Betz G., 1983, SPUTTERING PARTICLE, P11

[7] LOCAL IN-DEPTH ANALYSIS OF CERAMIC MATERIALS BY NEUTRAL BEAM SECONDARY ION MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1980, 34 (3-4): : 361 - 373

[8] BORCHARDT G, 1981, MIKROCHIM ACTA, V2, P421

[9] ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS [J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) : 109 - 115

[10] ANALYSIS OF POLYMER SURFACES BY SIMS .4. A STUDY OF SOME ACRYLIC HOMO-POLYMERS AND CO-POLYMERS [J]. SURFACE AND INTERFACE ANALYSIS, 1984, 6 (04) : 184 - 192