ORIENTATIONAL DEPENDENCE OF THE DISSOCIATION OF H-2+ AT A NI(110) SURFACE

被引:20
作者
TAPPE, W
NIEHOF, A
SCHMIDT, K
HEILAND, W
机构
[1] FB Physik, Universität Osnabrück, Osnabrück
来源
EUROPHYSICS LETTERS | 1991年 / 15卷 / 04期
关键词
CHARGE TRANSFER; SYMMETRY AND CONSERVATION LAWS;
D O I
10.1209/0295-5075/15/4/007
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
H-2+ ions dissociate by charge capture from surfaces at low velocity. Part of these charge exchange processes depend on the orientation of the molecular axis with respect to the surface normal. The effect is demonstrated by measuring the angular distribution of the scattered particles.
引用
收藏
页码:405 / 409
页数:5
相关论文
共 15 条
[2]  
ECHENIQUE PM, 1989, INT J QUANTUM CHEM, P521
[3]  
Eckstein W., 1981, INELASTIC PARTICLE S, P157
[4]   SCATTERING OF MOLECULAR AND ATOMIC-HYDROGEN IONS FROM SINGLE-CRYSTAL SURFACES [J].
HEILAND, W ;
BEITAT, U ;
TAGLAUER, E .
PHYSICAL REVIEW B, 1979, 19 (04) :1677-1682
[5]   THEORY OF CHARGE-EXCHANGE IN THE SCATTERING OF MOLECULAR-IONS FROM SIMPLE METALS [J].
IMKE, U ;
SNOWDON, KJ ;
HEILAND, W .
PHYSICAL REVIEW B, 1986, 34 (01) :41-47
[6]   RESONANT TRANSITION RATES FOR CHARGE-TRANSFER BETWEEN DIATOMIC MOLECULAR-IONS AND SIMPLE METALS [J].
IMKE, U ;
SNOWDON, KJ ;
HEILAND, W .
PHYSICAL REVIEW B, 1986, 34 (01) :48-53
[7]   A STUDY OF DISSOCIATIVE ATTACHMENT IN H-2+-AL(110) SURFACE SCATTERING AT LOW ION ENERGIES (300-900 EV) [J].
IMKE, U ;
SCHUBERT, S ;
SNOWDON, KJ ;
HEILAND, W .
SURFACE SCIENCE, 1987, 189 :960-966
[8]   CHARGE-EXCHANGE IN ATOM SURFACE COLLISIONS [J].
LOS, J ;
GEERLINGS, JJC .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1990, 190 (03) :133-190
[9]   CHARGE-EXCHANGE AND ENERGY-DISSIPATION OF PARTICLES INTERACTING WITH METAL-SURFACES [J].
NARMANN, A ;
MONREAL, R ;
ECHENIQUE, PM ;
FLORES, F ;
HEILAND, W ;
SCHUBERT, S .
PHYSICAL REVIEW LETTERS, 1990, 64 (13) :1601-1604
[10]   EXPERIMENTAL REALIZATION OF LOW-ENERGY SURFACE CHANNELING [J].
NIEHOF, A ;
HEILAND, W .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1990, 48 (1-4) :306-310