HIGH-ENERGY RESOLUTION IN X-RAY-SCATTERING WITH THE SPECTROMETER INELAX .1. THE PRINCIPLES AND THE TEST INSTRUMENT

被引:7
作者
BURKEL, E [1 ]
DORNER, B [1 ]
ILLINI, T [1 ]
PEISL, J [1 ]
机构
[1] INST MAX VON LAUE PAUL LANGEVIN,F-38042 GRENOBLE,FRANCE
关键词
D O I
10.1107/S0021889891007884
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Very high-energy resolution measurements using X-rays can be achieved by extreme backreflection (Bragg angle close to 90-degrees) from perfect crystals. This technique, combined with the high intensity of X-rays emitted by synchrotron-radiation sources, allowed the development of the instrument INELAX for inelastic scattering experiments. The principles and test results are discussed.
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页码:1042 / 1050
页数:9
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