HIGH-ENERGY RESOLUTION IN X-RAY-SCATTERING WITH THE SPECTROMETER INELAX .1. THE PRINCIPLES AND THE TEST INSTRUMENT

被引：7

作者：

BURKEL, E ^{[1
]}

DORNER, B ^{[1
]}

ILLINI, T ^{[1
]}

PEISL, J ^{[1
]}

机构：

[1] INST MAX VON LAUE PAUL LANGEVIN,F-38042 GRENOBLE,FRANCE

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1991年 / 24卷 / pt 6期

关键词：

D O I：

10.1107/S0021889891007884

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Very high-energy resolution measurements using X-rays can be achieved by extreme backreflection (Bragg angle close to 90-degrees) from perfect crystals. This technique, combined with the high intensity of X-rays emitted by synchrotron-radiation sources, allowed the development of the instrument INELAX for inelastic scattering experiments. The principles and test results are discussed.

引用

页码：1042 / 1050

页数：9

共 32 条

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