DIAGNOSIS OF OPTICAL PROPERTIES AND STRUCTURE OF LANTHANUM HEXABORIDE THIN-FILMS

被引：31

作者：

PESCHMANN, KR ^{[1
]}

CALOW, JT ^{[1
]}

KNAUFF, KG ^{[1
]}

机构：

[1] PHILIPS FORSCH LAB AACHEN GMBH, AACHEN, WEST GERMANY

来源：

关键词：

D O I：

10.1063/1.1662545

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2252 / 2256

页数：5

共 8 条

[1]

KAUER E, 1965, PHILIPS TECH REV, V26, P33

[2] OPTICAL AND ELECTRICAL PROPERTIES OF LAB6 [J].

KAUER, E .

PHYSICS LETTERS, 1963, 7 (03) :171-173

[3] PHASE SHIFT EFFECTS IN FRINGES OF EQUAL CHROMATIC ORDER [J].

KOESTER, CJ .

NILSSON, PO .

APPLIED OPTICS, 1968, 7 (03) :435-&

[5]

PESCHMANN KR, 1970, RV1071069 BUND WISS

[6] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

[7]

TOLANSKY S, 1964, MULTIPLE BEAM INTERF

[8] EPITAXIAL GROWTH OF SILICON BY VACUUM EVAPORATION [J].

UNVALA, BA .