DIFFRACTION AND DIFFUSE-SCATTERING FROM MATERIALS WITH MICROFOCUSED X-RAYS

被引:19
作者
RIEKEL, C
ENGSTROM, P
机构
[1] European Synchrotron Radiation Facility, F-38043 Grenoble Cedex
关键词
D O I
10.1016/0168-583X(94)00705-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Status and development possibilities of microfocusing experiments in wide- and small angle scattering at the ESRF microfocus beamline are reported. The routinely available beam sizes range from approximate to 200 pm to 7 mu m using mirror/monochromator optics. For the smallest beam size post collimation is required. Optics based on glass capillary and Bragg-Fresnel elements have been tested for mu m or sub mu m applications.
引用
收藏
页码:224 / 230
页数:7
相关论文
共 16 条
[11]  
Bilderback, Hoffman, Thiel, Nanometer spatial resolution achieved in hard x-ray imaging and Laue diffraction experiments, Science, 263, (1994)
[12]  
Lorenzen, Riekel, Eichler, Hausermann, J. Phys. (Paris), 3, 8 C, (1994)
[13]  
Bassett, Polymer, 17, (1976)
[14]  
Mittelbach, Ph.D. Thesis, (1994)
[15]  
Engstrom, Touet, ESRF Annual Report, (1993)
[16]  
Chanzy, Riekel, Snigireva, Snigirev, Proc. 4th Int. Conf. on X-ray Microscopy, X-Ray Microscopy, 4, (1994)