Interpretation of electron micrographs of silica surface replicas

被引：21

作者：

Heidenreich, RD ^{[1
]}

机构：

[1] Dow Chem Co, Milland, MI USA

来源：

JOURNAL OF APPLIED PHYSICS | 1943年 / 14卷 / 07期

关键词：

D O I：

10.1063/1.1714992

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：312 / 320

页数：9

共 11 条

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