TIME DOMAIN RESPONSE OF AL/DY2O3/AL THIN-FILM CAPACITORS AND THEIR AC CHARACTERISTICS

被引：9

作者：

WIKTORCZYK, T ^{[1
]}

NITSCH, K ^{[1
]}

BOBER, Z ^{[1
]}

机构：

[1] WROCLAW TECH UNIV,INST ELECTR TECHNOL,PL-50370 WROCLAW,POLAND

来源：

关键词：

D O I：

10.1016/0040-6090(88)90340-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

SOLID STATE DEVICES, MIM

引用

页码：13 / 20

页数：8

共 11 条

[1]

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[2]

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[3]

Daniel V. V., 1967, DIELECTRIC RELAXATIO

[4]

DASGUPTA DK, 1976, J PHYS D APPL PHYS, V9, P829, DOI 10.1088/0022-3727/9/5/016

[5] DIELECTRIC BEHAVIOR OF DYSPROSIUM OXIDE-FILMS [J].

GOSWAMI, A ;

VARMA, RR .

[6]

Jonscher A. K., 1980, PHYS THIN FILMS, V11, P205

[7] UNIVERSAL DIELECTRIC RESPONSE [J].

JONSCHER, AK .

[8]

Macdonald J. R., 1976, Springer eBooks, P149, DOI [10.1007/978-94-010-1889-0_6, DOI 10.1007/978-94-010-1889-0_6]

[9]

MITRA NC, 1985, PHYS STATUS SOLIDI A, V88, P175, DOI 10.1002/pssa.2210880119

WIKTORCZYK, T ;

WESOLOWSKA, C .