SURFACE-COMPOSITION OF CLEAN, EPITAXIAL THIN-FILMS OF YBA2CU3O7-X FROM QUANTITATIVE X-RAY PHOTOEMISSION SPECTROSCOPY ANALYSIS

被引：49

作者：

FRANK, G

ZIEGLER, C

GOPEL, W

机构：

[1] Institute of Physical and Theoretical Chemistry, University of T̈bingen

来源：

PHYSICAL REVIEW B | 1991年 / 43卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.43.2828

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Angle-dependent x-ray photoemission spectra (XPS) of epitaxial thin-film YBa2Cu3O7-x show characteristic reversible and distinct changes with different surface treatments. These changes are analyzed by applying a new model for the quantitative XPS analysis, which takes into consideration the anisotropic structure of c-axis-oriented YBa2Cu3O7-x. The analysis makes it possible to differentiate between different elemental compositions of the outer layers in the surface unit cell. Evaluations of our experimental data indicate that only surfaces with a nominal BaO and CuO layer composition exist in the outermost atomic layer.

引用

页码：2828 / 2834

页数：7

共 43 条

[1]

BAUDENBACHER F, 1990, VERH DTSCH PHYS GES, V25, P1212

[2] LOW-TEMPERATURE PREPARATION OF SUPERCONDUCTING YBA2CU3O7-DELTA FILMS ON SI, MGO, AND SRTIO3 BY THERMAL COEVAPORATION [J].