SURFACE AND NEAR-SURFACE CHEMICAL CHARACTERIZATION BY LOW-ENERGY ELECTRON-INDUCED X-RAY SPECTROMETRY (LEEIXS) - A REVIEW

被引：43

作者：

ROMAND, M

BADOR, R

CHARBONNIER, M

GAILLARD, F

机构：

来源：

X-RAY SPECTROMETRY | 1987年 / 16卷 / 01期

关键词：

D O I：

10.1002/xrs.1300160104

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：7 / 16

页数：10

共 48 条

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BADOR, R ;

PEREZ, A ;

DESUZINGES, C ;

ROMAND, M .

APPLIED SURFACE SCIENCE, 1985, 24 (02) :173-188

[2] ANALYSIS OF THIN AND ULTRATHIN FILMS - NEW POSSIBILITIES WITH X-RAY-EMISSION SPECTROMETRY [J].

BADOR, R ;

ROCHE, A ;

BOUYSSOUX, G ;

ROMAND, M .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1978, 33 (08) :437-446

[3]

BADOR R, 1981, ADV XRAY ANAL, V24, P351

[4]

Bethe H, 1930, ANN PHYS-BERLIN, V5, P325

[5]

Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

[6]

CHARBONNIER M, 1981, 22ND P C SPECTR INT, P205

[7]

CHARBONNIER M, 1985, 24TH P C SPECTR INT, P622

[8]

COPPOLA F, 1980, 8TH P INT C XRAY OPT, P581

[9]

DAVIDSON FD, 1967, NORELCO REP, V14, P3

[10]

DURUPT P, 1983, THESIS LYON

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