ANALYSIS OF THIN AND ULTRATHIN FILMS - NEW POSSIBILITIES WITH X-RAY-EMISSION SPECTROMETRY

被引：7

作者：

BADOR, R

ROCHE, A

BOUYSSOUX, G

ROMAND, M

机构：

[1] UNIV LYON 1,CHIM APPL & GEN CHIM LAB,CNRS,EQUIPE RECH 300,F-69621 VILLEURBANNE,FRANCE

[2] UNIV LYON 1,PHYS PHARMACEUT LAB,F-69621 VILLEURBANNE,FRANCE

来源：

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY | 1978年 / 33卷 / 08期

关键词：

D O I：

10.1016/0584-8547(78)80053-6

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：437 / 446

页数：10

共 16 条

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[2]

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[4] CHARACTERIZATION OF THIN ANODIZED FILMS ON ALUMINUM WITH SOFT-X-RAY SPECTROSCOPY [J].

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[5] XPS AND AES STUDIES OF ANODIC PASSIVE FILMS GROWN ON CHROMIUM ELECTRODES IN SULFURIC-ACID BATHS [J].

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ROMAND, M ;

POLASCHEGG, HD ;

CALOW, JT .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (02) :185-196

[6]

Castaing R, 1960, ADV ELECTRONICS ELEC, V13, P317, DOI [DOI 10.1016/S0065-2539(08)60212-7, 10.1016/S0065-2539(08)60212-7]

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FELDMAN CF, 1970, PHYS REV, V117, P455

[8]

ROCHE A, SOUMIS ANALUSIS

[9]

ROCHE A, 1977, 33E C GAMS PAR

[10] AUGER SPECTROMETRY OF PASSIVATED FILMS FORMED ON TANTALUM IN PHOSPHORIC-ACID SOLUTION [J].

ROMAND, M ;

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BAUN, WL .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (01) :41-50

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