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OBSERVATION OF FINE COMPOSITIONAL FLUCTUATION IN GAAS/ALXGA1-XAS SUPERSTRUCTURE USING COMPOSITION ANALYSIS BY THICKNESS-FRINGE (CAT) METHOD

被引：15
作者：
KAKIBAYASHI, H
NAGATA, F
ONO, Y
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷 / 05期
关键词：
D O I：
10.1143/JJAP.26.770
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：770 / 771
页数：2
相关论文
共 5 条
[1]   SIMULATION STUDIES OF A COMPOSITION ANALYSIS BY THICKNESS-FRINGE (CAT) IN AN ELECTRON-MICROSCOPE IMAGE OF GAAS/ALXGA1-XAS SUPERSTRUCTURE [J].
KAKIBAYASHI, H ;
NAGATA, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (11) :1644-1649
[2]   NEW ELECTRON-MICROSCOPY FOR COMPOSITION ANALYSIS OF GAAS/ALXGA1-XAS HETEROINTERFACES [J].
KAKIBAYASHI, H ;
NAGATA, F .
SURFACE SCIENCE, 1986, 174 (1-3) :84-87
[3]   COMPOSITION DEPENDENCE OF EQUAL THICKNESS FRINGES IN AN ELECTRON-MICROSCOPE IMAGE OF GAAS/ALXGA1-XAS MULTILAYER STRUCTURE [J].
KAKIBAYASHI, H ;
NAGATA, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (12) :L905-L907
[4]  
KAKIBAYASHI H, 1986, J ELECTRON MICROSC S, V35, P1495
[5]   TEM OBSERVATIONS OF COMPOSITIONAL VARIATIONS IN ALXGA1-XAS GROWN BY OMVPE [J].
KUESTERS, KH ;
DECOOMAN, BC ;
SHEALY, JR ;
CARTER, CB .
JOURNAL OF CRYSTAL GROWTH, 1985, 71 (03) :514-518
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