X-RAY-DIFFRACTION LINE BROADENING DUE TO DIFFRACTOMETER CONDITION AS A FUNCTION OF 20

The line profile due to diffractometer instrumental conditions was obtained from the measured line profile of a standard specimen by eliminating the spectral broadening, applying a model for the wavelength distribution. Under common experimental conditions, it was found that for 2 theta >50 degrees the spectral broadening is dominant in the line profile, and that for the larger 2 theta values for small values of the harmonic number the Fourier coefficients corresponding to the broadening caused by the instrumental conditions may be assumed to be independent of 2 theta.