THE ELECTRIC-FIELD DISTRIBUTION IN THE FIELD-ION MICROSCOPE AS A FUNCTION OF SPECIMEN SHANK

被引：18

作者：

GIPSON, GS ^{[1
]}

EATON, HC ^{[1
]}

机构：

[1] TENNESSEE TECHNOL UNIV,DEPT ENGN SCI & MECH,COOKEVILLE,TN 38501

来源：

JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 10期

关键词：

D O I：

10.1063/1.327473

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：5537 / 5539

页数：3

相关论文

共 7 条

[1] ELECTRIC FIELD AND STRESS ON A FIELD-ION SPECIMEN
BIRDSEYE, PJ
SMITH, DA
[J]. SURFACE SCIENCE, 1970, 23 (01) : 198 - &
[2] PROPERTIES OF TIP-PLANE CONFIGURATION
COELHO, R
DEBEAU, J
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (09) : 1266 - &
[3] ELECTRIC-FIELD DISTRIBUTION WITHIN THE FIELD-ION MICROSCOPE AND NEAR THE SURFACE OF FIELD EMITTERS
GIPSON, GS
YANNITELL, DW
EATON, HC
[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1979, 12 (07) : 987 - 996
[4] Gomer R., 1961, FIELD EMISSION FIELD
[5] FIELD CALIBRATION USING ENERGY-DISTRIBUTION OF FIELD IONIZATION
SAKURAI, T
MULLER, EW
[J]. PHYSICAL REVIEW LETTERS, 1973, 30 (12) : 532 - 535
[6] FIELD CALIBRATION USING ENERGY-DISTRIBUTION OF A FREE-SPACE FIELD-IONIZATION
SAKURAI, T
MULLER, EW
[J]. JOURNAL OF APPLIED PHYSICS, 1977, 48 (06) : 2618 - 2625
[7] BEHAVIOUR OF FIELD-ION MICROSCOPE - A GAS DYNAMICAL CALCULATION
VANEEKEL.HA
[J]. SURFACE SCIENCE, 1970, 21 (01) : 21 - &