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SCANNING ELECTRON-MICROSCOPE CHARGE-COLLECTION IMAGES OF GRAIN-BOUNDARIES
被引:41
作者
:
MAREK, J
论文数:
0
引用数:
0
h-index:
0
MAREK, J
机构
:
来源
:
JOURNAL OF APPLIED PHYSICS
|
1982年
/ 53卷
/ 03期
关键词
:
D O I
:
10.1063/1.330640
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1454 / 1460
页数:7
相关论文
共 25 条
[1]
ANDERSEN CA, 1966, ELECTRON MICROPROBE, P58
[2]
AUTHIER B, 1978, FESTKORPERPROBLEME, V18, P1
[3]
BLOSS WH, 1980, 3RD EC PHOT SOL EN C, P340
[4]
COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
DONOLATO, C
KLANN, H
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
KLANN, H
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(03)
: 1624
-
1633
[5]
CONTRAST AND RESOLUTION OF SEM CHARGE-COLLECTION IMAGES OF DISLOCATIONS
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung
DONOLATO, C
[J].
APPLIED PHYSICS LETTERS,
1979,
34
(01)
: 80
-
81
[6]
QUANTITATIVE PROPERTIES OF SEM-EBIC IMAGES OF STACKING-FAULTS IN SILICON
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
DONOLATO, C
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1980,
19
(12)
: L771
-
L774
[7]
DONOLATO C, 1979, 12TH P ANN SEM S, P257
[8]
DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331
[9]
DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS
EVERHART, TE
论文数:
0
引用数:
0
h-index:
0
EVERHART, TE
HOFF, PH
论文数:
0
引用数:
0
h-index:
0
HOFF, PH
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(13)
: 5837
-
&
[10]
LOW-COST SOLAR-CELLS BASED ON LARGE-AREA UNCONVENTIONAL SILICON
FISCHER, H
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
FISCHER, H
PSCHUNDER, W
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
PSCHUNDER, W
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(04)
: 438
-
442
←
1
2
3
→
共 25 条
[1]
ANDERSEN CA, 1966, ELECTRON MICROPROBE, P58
[2]
AUTHIER B, 1978, FESTKORPERPROBLEME, V18, P1
[3]
BLOSS WH, 1980, 3RD EC PHOT SOL EN C, P340
[4]
COMPUTER-SIMULATION OF SEM ELECTRON-BEAM INDUCED CURRENT IMAGES OF DISLOCATIONS AND STACKING-FAULTS
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
DONOLATO, C
KLANN, H
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung, 7000 Stuttgart 80, Germany
KLANN, H
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(03)
: 1624
-
1633
[5]
CONTRAST AND RESOLUTION OF SEM CHARGE-COLLECTION IMAGES OF DISLOCATIONS
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
机构:
Max-Planck-Institut für Festkörperforschung
DONOLATO, C
[J].
APPLIED PHYSICS LETTERS,
1979,
34
(01)
: 80
-
81
[6]
QUANTITATIVE PROPERTIES OF SEM-EBIC IMAGES OF STACKING-FAULTS IN SILICON
DONOLATO, C
论文数:
0
引用数:
0
h-index:
0
DONOLATO, C
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1980,
19
(12)
: L771
-
L774
[7]
DONOLATO C, 1979, 12TH P ANN SEM S, P257
[8]
DRESCHER H, 1970, Z ANGEW PHYSIK, V29, P331
[9]
DETERMINATION OF KILOVOLT ELECTRON ENERGY DISSIPATION VS PENETRATION DISTANCE IN SOLID MATERIALS
EVERHART, TE
论文数:
0
引用数:
0
h-index:
0
EVERHART, TE
HOFF, PH
论文数:
0
引用数:
0
h-index:
0
HOFF, PH
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(13)
: 5837
-
&
[10]
LOW-COST SOLAR-CELLS BASED ON LARGE-AREA UNCONVENTIONAL SILICON
FISCHER, H
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
FISCHER, H
PSCHUNDER, W
论文数:
0
引用数:
0
h-index:
0
机构:
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
AEG TELEFUNKEN,DIV SEMICOND,HEILBRONN,FED REP GER
PSCHUNDER, W
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1977,
24
(04)
: 438
-
442
←
1
2
3
→