OPTICAL MEASUREMENTS OF THE MINIGAPS IN ELECTRON INVERSION-LAYERS ON VICINAL PLANES OF SI(001)

被引：11

作者：

KAMGAR, A

STURGE, MD

TSUI, DC

机构：

来源：

PHYSICAL REVIEW B | 1980年 / 22卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.22.841

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：841 / 847

页数：7

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