QUICK SAMPLE EXCHANGE MANIPULATOR FOR DUAL MOLECULAR-BEAM AND SCANNING TUNNELING MICROSCOPY EXPERIMENTS

被引:11
作者
SULLIVAN, DJD
KUMMEL, AC
机构
关键词
D O I
10.1063/1.1143726
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Here we describe the design, construction, and operation of an ultrahigh-vacuum manipulator for combined molecular beam and scanning tunneling microscopy experiments. The manipulator allows (1) sample transfer, (2) liquid-nitrogen cooling, (3) electron beam heating, (4) rotation about the vertical and horizontal axes, and (5) electrical isolation of the sample. The unique features of the design are (a) direct transfer of a 3/8-in.-diam sample to a load-lock sample carrier without the use of a second transfer arm and (b) sample mounting and electron beam heating systems that permit the sample to be several hundred degrees hotter than the sample mounting plate, thus minimizing sample contamination.
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页码:4285 / 4288
页数:4
相关论文
共 13 条
[1]  
AUCIELLO O, 1977, NUCL INSTRUM METHODS, V179, P349
[2]  
BRONCKERS RPN, 1981, P NUCL INSTRUM METHO, V179, P125
[3]   ULTRAHIGH-VACUUM MULTIPURPOSE OFFSET MANIPULATOR FOR SURFACE AND THIN-FILM REACTION STUDIES [J].
CRIDER, CA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08) :1156-1160
[4]   EFFECT OF NICKEL ON CLEAN SILICON SURFACES - TRANSPORT AND STRUCTURE [J].
DOLBAK, AE ;
OLSHANETSKY, BZ ;
STENIN, SI ;
TEYS, SA ;
GAVRILOVA, TA .
SURFACE SCIENCE, 1989, 218 (01) :37-54
[5]   3-AXIS SAMPLE MANIPULATOR WITH XYZ TRANSLATION FOR USE IN UHV [J].
ENGEL, T ;
BRAID, D ;
CONRAD, EH .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (03) :487-489
[6]   SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW LETTERS, 1986, 56 (18) :1972-1975
[7]   DETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY [J].
HAMERS, RJ ;
KOHLER, UK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2854-2859
[8]  
HO CY, 1974, J PHYS CHEM, V3
[9]  
KERN W, 1984, SEMICONDUCTOR INTERN, V94
[10]   SCANNING TUNNELING MICROSCOPE [J].
PARK, SI ;
QUATE, CF .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1987, 58 (11) :2010-2017