SCANNING TUNNELING MICROSCOPE

被引：68

作者：

PARK, SI

QUATE, CF

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1987年 / 58卷 / 11期

关键词：

D O I：

10.1063/1.1139508

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：2010 / 2017

页数：8

共 20 条

[1]

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[2] SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].

BINNIG, G ;

SMITH, DPE .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689

[3] SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].

BINNING, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61

[4]

COOMBS JH, 1986, IBM J RES DEV, V36, P455

[5] A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].

DEMUTH, JE ;

HAMERS, RJ ;

TROMP, RM ;

WELLAND, ME .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) :396-402

[6]

DOUGLAS PES, 1985, REV SCI INSTRUM, V56, P1970

[7] SCANNING TUNNELING MICROSCOPY STUDIES OF SI(111)-2X1 SURFACES [J].

FEENSTRA, RM ;

THOMPSON, WA ;

FEIN, AP .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1315-1319

[8] REAL-SPACE OBSERVATION OF PI-BONDED CHAINS AND SURFACE DISORDER ON SI(111)2X1 [J].

FEENSTRA, RM ;

THOMPSON, WA ;

FEIN, AP .

PHYSICAL REVIEW LETTERS, 1986, 56 (06) :608-611

[9] SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE [J].

HAMERS, RJ ;

TROMP, RM ;

DEMUTH, JE .

PHYSICAL REVIEW LETTERS, 1986, 56 (18) :1972-1975

[10] MULTIPLE-TIP INTERPRETATION OF ANOMALOUS SCANNING-TUNNELING-MICROSCOPY IMAGES OF LAYERED MATERIALS [J].

MIZES, HA ;

PARK, S ;

HARRISON, WA .

PHYSICAL REVIEW B, 1987, 36 (08) :4491-4494

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