SCANNING TUNNELING MICROSCOPY STUDIES OF SI(111)-2X1 SURFACES

被引：38

作者：

FEENSTRA, RM

THOMPSON, WA

FEIN, AP

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1986年 / 4卷 / 03期

关键词：

D O I：

10.1116/1.573600

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：1315 / 1319

页数：5

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