STRUCTURE-ANALYSIS OF SI(111)2X1 WITH LOW-ENERGY ELECTRON-DIFFRACTION

被引：105

作者：

HIMPSEL, FJ

MARCUS, PM

TROMP, R

BATRA, IP

COOK, MR

JONA, F

LIU, H

机构：

[1] IBM CORP,RES LAB,SAN JOSE,CA 95193

[2] SUNY STONY BROOK,DEPT MAT SCI & ENGN,STONY BROOK,NY 11794

来源：

PHYSICAL REVIEW B | 1984年 / 30卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.30.2257

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：2257 / 2259

页数：3

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PHYSICAL REVIEW B, 1981, 24 (04) :2003-2008

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