A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES

被引:67
作者
DEMUTH, JE [1 ]
HAMERS, RJ [1 ]
TROMP, RM [1 ]
WELLAND, ME [1 ]
机构
[1] UNIV CAMBRIDGE,DEPT ELECT ENGN,CAMBRIDGE CB2 1PZ,ENGLAND
关键词
Image processing;
D O I
10.1147/rd.304.0396
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A new design is described for a scanning tunneling microscope intended for surface science studies. The performance of the microscope is evaluated from tunneling images obtained of the Si(111)7 multiplied by 7 surface. Periodic structures, point defects, and grain boundary structures are observed with atomic-scale resolution and are discussed. Illustrations of various types of image processing and data display are presented.
引用
收藏
页码:396 / 402
页数:7
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