THE CONTAMINATION IN EVAPORATED FILMS BY THE MATERIAL OF THE SOURCE

[1] BLEARS J, 1951, J SCI INSTRUM S, V1, P36

[2] Feigl F., 1947, QUALITATIVE ANAL SPO

[3] MEASUREMENT OF THE THICKNESS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (377): : 419 - 425

[4] The dissociation of hydrogen into atoms [Part II] Calculation of the degree of dissociation and the heat of formation [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1915, 37 : 417 - 458

[5] LANGMUIR I, 1913, T AIEE, V32, P1893

[6] THE STRUCTURE OF EVAPORATED METAL FILMS AND THEIR OPTICAL PROPERTIES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1950, 40 (04) : 203 - 211

[7] Tolansky S., 1948, MULTIPLE BEAM INTERF

[1] BLEARS J, 1951, J SCI INSTRUM S, V1, P36

[2] Feigl F., 1947, QUALITATIVE ANAL SPO

[3] MEASUREMENT OF THE THICKNESS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (377): : 419 - 425

[4] The dissociation of hydrogen into atoms [Part II] Calculation of the degree of dissociation and the heat of formation [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1915, 37 : 417 - 458

[5] LANGMUIR I, 1913, T AIEE, V32, P1893

[6] THE STRUCTURE OF EVAPORATED METAL FILMS AND THEIR OPTICAL PROPERTIES [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1950, 40 (04) : 203 - 211

[7] Tolansky S., 1948, MULTIPLE BEAM INTERF