A NEW HIGH-PRECISION OPTICAL TECHNIQUE TO MEASURE MAGNETOSTRICTION OF A THIN MAGNETIC-FILM DEPOSITED ON A SUBSTRATE

被引：95

作者：

TAM, AC

SCHROEDER, H

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1989年 / 25卷 / 03期

关键词：

D O I：

10.1109/20.24502

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：2629 / 2638

页数：10

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