FAST, ACCURATE SECONDARY-ELECTRON YIELD MEASUREMENTS AT LOW PRIMARY ENERGIES

被引：47

作者：

HENRICH, VE ^{[1
]}

机构：

[1] MIT,LINCOLN LAB,LEXINGTON,MA 02173

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1973年 / 44卷 / 04期

关键词：

D O I：

10.1063/1.1686155

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：456 / 462

页数：7

相关论文

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