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IMAGING AND SMALL SPOT ANALYSIS WITH ESCA
被引:8
作者
:
ALLISON, DA
论文数:
0
引用数:
0
h-index:
0
ALLISON, DA
ANATER, TF
论文数:
0
引用数:
0
h-index:
0
ANATER, TF
机构
:
来源
:
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
|
1987年
/ 43卷
/ 3-4期
关键词
:
D O I
:
10.1016/0368-2048(87)80005-1
中图分类号
:
O433 [光谱学];
学科分类号
:
0703 ;
070302 ;
摘要
:
引用
收藏
页码:243 / 262
页数:20
相关论文
共 6 条
[1]
PHOTOELECTRON SPECTROMICROSCOPY
BEAMSON, G
论文数:
0
引用数:
0
h-index:
0
BEAMSON, G
PORTER, HQ
论文数:
0
引用数:
0
h-index:
0
PORTER, HQ
TURNER, DW
论文数:
0
引用数:
0
h-index:
0
TURNER, DW
[J].
NATURE,
1981,
290
(5807)
: 556
-
561
[2]
FAST OPTICAL POSITION-SENSITIVE DETECTOR FOR MCPHERSON ESCA-36
BERTRAND, PA
论文数:
0
引用数:
0
h-index:
0
BERTRAND, PA
KALINOWSKI, WJ
论文数:
0
引用数:
0
h-index:
0
KALINOWSKI, WJ
TRIBBLE, LE
论文数:
0
引用数:
0
h-index:
0
TRIBBLE, LE
TOLENTINO, LU
论文数:
0
引用数:
0
h-index:
0
TOLENTINO, LU
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1983,
54
(03)
: 387
-
389
[3]
IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES
GURKER, N
论文数:
0
引用数:
0
h-index:
0
GURKER, N
EBEL, MF
论文数:
0
引用数:
0
h-index:
0
EBEL, MF
EBEL, H
论文数:
0
引用数:
0
h-index:
0
EBEL, H
[J].
SURFACE AND INTERFACE ANALYSIS,
1983,
5
(01)
: 13
-
19
[4]
SCANNING ESCA - NEW DIMENSION FOR ELECTRON-SPECTROSCOPY
HOVLAND, CT
论文数:
0
引用数:
0
h-index:
0
机构:
PHYS ELECTR IND INC,EDEN PRAIRIE,MN 55343
PHYS ELECTR IND INC,EDEN PRAIRIE,MN 55343
HOVLAND, CT
[J].
APPLIED PHYSICS LETTERS,
1977,
30
(06)
: 274
-
275
[5]
LOW-DISTORTION RESISTIVE ANODES FOR 2-DIMENSIONAL POSITION-SENSITIVE MCP SYSTEMS
LAMPTON, M
论文数:
0
引用数:
0
h-index:
0
LAMPTON, M
CARLSON, CW
论文数:
0
引用数:
0
h-index:
0
CARLSON, CW
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1979,
50
(09)
: 1093
-
1097
[6]
WATSON JM, 1973, Patent No. 3766381
←
1
→
共 6 条
[1]
PHOTOELECTRON SPECTROMICROSCOPY
BEAMSON, G
论文数:
0
引用数:
0
h-index:
0
BEAMSON, G
PORTER, HQ
论文数:
0
引用数:
0
h-index:
0
PORTER, HQ
TURNER, DW
论文数:
0
引用数:
0
h-index:
0
TURNER, DW
[J].
NATURE,
1981,
290
(5807)
: 556
-
561
[2]
FAST OPTICAL POSITION-SENSITIVE DETECTOR FOR MCPHERSON ESCA-36
BERTRAND, PA
论文数:
0
引用数:
0
h-index:
0
BERTRAND, PA
KALINOWSKI, WJ
论文数:
0
引用数:
0
h-index:
0
KALINOWSKI, WJ
TRIBBLE, LE
论文数:
0
引用数:
0
h-index:
0
TRIBBLE, LE
TOLENTINO, LU
论文数:
0
引用数:
0
h-index:
0
TOLENTINO, LU
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1983,
54
(03)
: 387
-
389
[3]
IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES
GURKER, N
论文数:
0
引用数:
0
h-index:
0
GURKER, N
EBEL, MF
论文数:
0
引用数:
0
h-index:
0
EBEL, MF
EBEL, H
论文数:
0
引用数:
0
h-index:
0
EBEL, H
[J].
SURFACE AND INTERFACE ANALYSIS,
1983,
5
(01)
: 13
-
19
[4]
SCANNING ESCA - NEW DIMENSION FOR ELECTRON-SPECTROSCOPY
HOVLAND, CT
论文数:
0
引用数:
0
h-index:
0
机构:
PHYS ELECTR IND INC,EDEN PRAIRIE,MN 55343
PHYS ELECTR IND INC,EDEN PRAIRIE,MN 55343
HOVLAND, CT
[J].
APPLIED PHYSICS LETTERS,
1977,
30
(06)
: 274
-
275
[5]
LOW-DISTORTION RESISTIVE ANODES FOR 2-DIMENSIONAL POSITION-SENSITIVE MCP SYSTEMS
LAMPTON, M
论文数:
0
引用数:
0
h-index:
0
LAMPTON, M
CARLSON, CW
论文数:
0
引用数:
0
h-index:
0
CARLSON, CW
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1979,
50
(09)
: 1093
-
1097
[6]
WATSON JM, 1973, Patent No. 3766381
←
1
→