IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES

[1] [Anonymous], XRAY MICROSCOPY

[2] PHOTOELECTRON SPECTROMICROSCOPY [J]. NATURE, 1981, 290 (5807) : 556 - 561

[3] X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES [J]. REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (05): : 263 - 280

[4] GURKER N, 1981, J ELECTRON SPECTROS, V14, P1

[5] GURKER N, 1977, THESIS TU WIEN AUSTR

[6] HOWLAND CT, 1977, 7TH P INT VAC C 3RD, P2363

[7] SELECTED AREA X-RAY PHOTO-ELECTRON SPECTROSCOPY [J]. SURFACE AND INTERFACE ANALYSIS, 1981, 3 (02) : 99 - 101

[8] The focusing of charged particles by a spherical condenser [J]. PHYSICAL REVIEW, 1938, 54 (10): : 818 - 826

[9] 1979, SSL MODEL 239 G POSI

[1] [Anonymous], XRAY MICROSCOPY

[2] PHOTOELECTRON SPECTROMICROSCOPY [J]. NATURE, 1981, 290 (5807) : 556 - 561

[3] X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES [J]. REVUE DE PHYSIQUE APPLIQUEE, 1975, 10 (05): : 263 - 280

[4] GURKER N, 1981, J ELECTRON SPECTROS, V14, P1

[5] GURKER N, 1977, THESIS TU WIEN AUSTR

[6] HOWLAND CT, 1977, 7TH P INT VAC C 3RD, P2363

[7] SELECTED AREA X-RAY PHOTO-ELECTRON SPECTROSCOPY [J]. SURFACE AND INTERFACE ANALYSIS, 1981, 3 (02) : 99 - 101

[8] The focusing of charged particles by a spherical condenser [J]. PHYSICAL REVIEW, 1938, 54 (10): : 818 - 826

[9] 1979, SSL MODEL 239 G POSI