X-RAY PHOTOELECTRON MICROANALYSIS AND MICROSCOPY - PRINCIPLE AND EXPECTED PERFORMANCES

被引：27

作者：

CAZAUX, J ^{[1
]}

机构：

[1] FAC SCI REIMS,LAB MICROSCOPIE & SPECTROSCOPIE ELECTR,GRP SPECTROSCOPIE ELECTR,51062 REIMS,FRANCE

来源：

REVUE DE PHYSIQUE APPLIQUEE | 1975年 / 10卷 / 05期

关键词：

D O I：

10.1051/rphysap:01975001005026300

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：263 / 280

页数：18

共 39 条

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