TEST SPECIMENS FOR A DARK FIELD STEM IMAGING - MEASURING LATTICE SPACING AND ELECTRON-PROBE SIZE OF A STEM AND TESTING VISIBILITY OF ATOMS OF VARIOUS ATOMIC NUMBERS

被引：10

作者：

OHTSUKI, M

机构：

来源：

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D O I：

10.1016/0304-3991(80)90036-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：325 / 332

页数：8

共 9 条

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