A SCANNING MICROSCOPE WITH 5 A RESOLUTION

[1] BROOKSHIER WK, 1965, J T NUCL SCI IEEE, VNS12, P104

[2] Butler, 1966, 6TH P INT C EL MICR, V1, P191

[3] ELECTRON GUN USING A FIELD EMISSION SOURCE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 576 - &

[4] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &

[5] DELTRAP JMH, 1964, THESIS CAMBRIDGE

[6] Durandeau P., 1957, REV OPT, V36, P205

[7] A TEST OBJECT AND CRITERIA FOR HIGH RESOLUTIONELECTRON MICROSCOPY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 : 1 - &

[8] KEEFE D, PRIVATE COMMUNICATIO

[9] HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (02): : 81 - &

[10] Raether H., 1965, SPRINGER TRACTS MODE, V38, P84

[1] BROOKSHIER WK, 1965, J T NUCL SCI IEEE, VNS12, P104

[2] Butler, 1966, 6TH P INT C EL MICR, V1, P191

[3] ELECTRON GUN USING A FIELD EMISSION SOURCE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 576 - &

[4] A HIGH-RESOLUTION SCANNING TRANSMISSION ELECTRON MICROSCOPE [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (13) : 5861 - &

[5] DELTRAP JMH, 1964, THESIS CAMBRIDGE

[6] Durandeau P., 1957, REV OPT, V36, P205

[7] A TEST OBJECT AND CRITERIA FOR HIGH RESOLUTIONELECTRON MICROSCOPY [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1968, 1 : 1 - &

[8] KEEFE D, PRIVATE COMMUNICATIO

[9] HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (02): : 81 - &

[10] Raether H., 1965, SPRINGER TRACTS MODE, V38, P84