A rapid method is described for the determination of K, Ca, Ti, Mn, Fe, Zn, Ga in geological samples and K, Ca, Mn, Fe, Ni, Cu, Zn in biological samples using an energy-dispersive X-ray fluorescence spectrometer. The method is based upon the linear relation between log (energy of the characteristic X-ray line) and log (fluorescent X-ray intensity/concentration) for the elements of atomic number from 13 to 35 (Al to Br), observed when Mo radiation is employed as an excitation source and a semiconductor detector is employed. The sample preparation is simple, requiring the addition of only three Internal standard elements for calibration. No standard samples are necessary. Theoretical consideration for the linear relation together with the analytical results is given. © 1979, American Chemical Society. All rights reserved.