TRACE-ELEMENT DETERMINATION WITH SEMICONDUCTOR DETECTOR X-RAY SPECTROMETERS

被引：160

作者：

GIAUQUE, RD ^{[1
]}

GOULDING, FS ^{[1
]}

JAKLEVIC, JM ^{[1
]}

PEHL, RH ^{[1
]}

机构：

[1] UNIV CALIF,LAWRENCE BERKELEY LAB,BERKELEY,CA 94720

来源：

ANALYTICAL CHEMISTRY | 1973年 / 45卷 / 04期

关键词：

D O I：

10.1021/ac60326a011

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

收藏

页码：671 / 681

页数：11

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