SIMPLE INTERNAL PHOTOEMISSION METHOD FOR DETERMINING SHAPE OF YIELD CURVES OF NEGATIVE ELECTRON AFFINITY SEMICONDUCTORS

被引：14

作者：

ESCHER, JS ^{[1
]}

WILLIAMS, BF ^{[1
]}

机构：

[1] RCA ELECT COMPONENTS,DAVID SARNOFF RES CTR,ELECTROOPTICS LAB,PRINCETON,NJ 08540

来源：

JOURNAL OF APPLIED PHYSICS | 1973年 / 44卷 / 01期

关键词：

D O I：

10.1063/1.1661930

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：525 / 526

页数：2

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