TRIPLE-CRYSTAL X-RAY-DIFFRACTOMETRY OF PERIODIC ARRAYS OF SEMICONDUCTOR QUANTUM WIRES

被引：27

作者：

HOLY, V

TAPFER, L

KOPPENSTEINER, E

BAUER, G

LAGE, H

BRANDT, O

PLOOG, K

机构：

[1] CTR NAZL RIC & SVILUPPO MAT, I-72023 MESAGNE, ITALY

[2] J KEPLER UNIV, INST SEMICOND PHYS, A-4040 LINZ, AUSTRIA

[3] MAX PLANCK INST FESTKORPERFORSCH, W-7900 STUTTGART, GERMANY

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 23期

关键词：

D O I：

10.1063/1.110228

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Kinematical diffraction theory and the optical coherence formalism have been used for calculating the diffuse x-ray scattering from periodic quantum wires. The method calculates the distribution of the diffusely scattered intensity in the reciprocal lattice plane. The simulated distributions have been compared with those measured on a InAs/GaAs quantum wire by means of triple crystal x-ray diffractometry and a good agreement has been achieved. The method can be applied to studies of internal stress relaxation in quantum wires.

引用

页码：3140 / 3142

页数：3

共 8 条

[1] X-RAY DOUBLE AND TRIPLE-CRYSTAL DIFFRACTOMETRY OF MOSAIC STRUCTURE IN HETEROEPITAXIAL LAYERS [J].