EXCITONIC INSULATOR PHASE IN TMSE0.45TE0.55

被引:129
作者
BUCHER, B
STEINER, P
WACHTER, P
机构
[1] Laboratorium f̈r Festkörperphysik, Eidgenössische Technische Hochschule
关键词
D O I
10.1103/PhysRevLett.67.2717
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We measured the Hall constant, resistivity, and magnetoresistance of the narrow-band-gap semiconductor TmSe0.45Te0.55 at pressures up to 17 kbar and down to 4 K. As the band gap can be closed with pressure, a semiconductor-metal transition occurs. Above 5 kbar, when the gap is partially closed, a transition to a more insulating phase is detected. The Hall effect at low temperature and high pressure reveals that the resistivity increase is caused by a condensation of free carriers, which strongly supports this as the first observation of the excitonic insulator ground state of condensed matter.
引用
收藏
页码:2717 / 2720
页数:4
相关论文
共 13 条
[1]  
BOPPART H, 1984, PHYS REV LETT, V53, P1759, DOI 10.1103/PhysRevLett.53.1759
[2]   PRESSURE-INDUCED SEMICONDUCTOR-METAL TRANSITION IN TMSE0.17TE0.83 [J].
BOPPART, H ;
WACHTER, P .
SOLID STATE COMMUNICATIONS, 1981, 38 (01) :75-77
[3]  
HALPERIN BI, 1968, SOLID STATE PHYS, V21, P116
[4]   DIELECTRIC ANOMALY AND THE VAPOR-LIQUID PHASE-TRANSITION IN MERCURY [J].
HEFNER, W ;
HENSEL, F .
PHYSICAL REVIEW LETTERS, 1982, 48 (15) :1026-1028
[5]   LOCAL-DENSITY THEORY OF MIXED-VALENCE TMSE AND THE VALENCE TRANSITION IN TM CHALCOGENIDES [J].
JANSEN, HJF ;
FREEMAN, AJ ;
MONNIER, R .
PHYSICAL REVIEW B, 1985, 31 (06) :4092-4095
[6]  
Knox R. S., 1963, SOLID STATE PHYS S, V5
[7]  
Kohn W., 1968, MANY BODY PHYSICS, P351
[8]   THE TRANSITION TO THE METALLIC STATE [J].
MOTT, NF .
PHILOSOPHICAL MAGAZINE, 1961, 6 (62) :287-309
[9]   ELECTRON-HOLE INTERACTION IN TMSE1-XTEX UNDER PRESSURE [J].
NEUENSCHWANDER, J ;
WACHTER, P ;
BUHRER, W ;
FISCHER, P .
JOURNAL OF APPLIED PHYSICS, 1988, 63 (08) :3399-3401
[10]   PRESSURE-DRIVEN SEMICONDUCTOR-METAL TRANSITION IN INTERMEDIATE-VALENCE TMSE1-XTEX AND THE CONCEPT OF AN EXCITONIC INSULATOR [J].
NEUENSCHWANDER, J ;
WACHTER, P .
PHYSICAL REVIEW B, 1990, 41 (18) :12693-12709