CHARACTERISTIC ENERGY LOSSES IN LAYERED METALLIC THIN FILMS

被引：11

作者：

Miller, William R., Jr. ^{[1
]}

Axelrod, Norman N. ^{[1
]}

机构：

[1] Univ Delaware, Dept Phys, Newark, DE 19716 USA

来源：

SOLID STATE COMMUNICATIONS | 1965年 / 3卷 / 07期

关键词：

D O I：

10.1016/0038-1098(65)90175-4

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Characteristic electron energy loss spectra of layered films of Bi-Mg have been measured and a new loss has been found at 12.9 +/- 0.2 eV. This loss can be interpreted as a surface plasma loss at the metal-metal interface. A surface loss in Al-Mg films was not reproducible, but a new loss was observed at 26.4 eV which can be interpreted as a single Al loss (15.4 eV) plus a single Mg loss (10.9 eV).

引用

页码：133 / 136

页数：4

共 20 条

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